ADO Laboratories validation facilities are equipped with state of the art RF test equipment for chip-level microwave probing to complete opto-electronic system characterization. Some of the test capabilities include full O/E S-parameter measurement using 20GHz Lightwave Component Analyzer (LCA), optical sensitivity measurement using 10Gb/s Bit-Error-Rate Tester (BERT). Full wire-bonding capabilities enable rapid Silicon and optical component prototyping. For select customers, ADO Labs provide full optical receiver characterization (OES21, sensitivity, etc) service. For a sample validation report and service quotation, contact email@example.com.
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